Sandip Kundu and his Phd student, Aswin Sreedhar, of the Electrical and Computer Engineering Department have just come out with a groundbreaking textbook, published by McGraw Hill and entitled, Nanoscale CMOS VLSI Circuits: Design for Manufacturability. This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, the text focuses on delivering higher performance and lower power consumption.
Costs, constraints, and computational efficiencies are also discussed in this practical resource.
The textbook covers:
- Current trends in CMOS VLSI design
- Semiconductor manufacturing technologies
- Process and device variability: analyses and modeling
- Manufacturing-Aware Physical Design Closure
- Metrology, manufacturing defects, and defect extraction
- Defect impact modeling and yield improvement techniques
- Physical design and reliability
- DFM tools and methodologies (July 2010)